ONEM is new idea for a microscope that uses the best of two worlds: Non-damaging probing with light, and high resolution using an electron-based read-out. The envisioned technique is damage-free, requires no labels, and allows for a resolution on the nanometer scale.
The project got funded under Horizon 2020 and will run for four years. We are collaborating with the groups of Mariana Amaro (Czech Academy of Sciences) and Sense Jan v.d. Molen (Leiden University). We still have open positions.
A schematic of the ONEM setup. A specimen within a liquid cell is illuminated (solid green line) and optically inspected (dashed green line) with a continuous-wave (cw) laser. Photoelectrons (solid red line) generated in the photocathode at the backside of the liquid cell are imaged in an aberration-corrected LEEM. For this, the electrons travel through a set of lenses and are reflected by an aberration-correcting mirror. The electron gun at the top is off in ONEM but it can be turned on to perform LEEM experiments, e.g., on the photocathode material (dashed red line).
