ONEM
Optical Near-field electron microscopy is a new idea for a microscope that uses the best of two worlds: Non-damaging probing with light, and high resolution using an electron-based read-out. The envisioned technique is damage-free, requires no labels, and allows for a resolution on the nanometer scale.
A detailed description of the proposal can be found here.
02.12.2021
18.08.2021
04.08.2021
