ONEM

Optical Near-field electron microscopy is a new idea for a microscope that uses the best of two worlds: Non-damaging probing with light, and high resolution using an electron-based read-out. The envisioned technique is damage-free, requires no labels, and allows for a resolution on the nanometer scale.

A detailed description of the proposal can be found here.

01.04.2025
 

Pulsed laser deposition assisted epitaxial growth of cesium telluride photocathodes for high brightness electron sources
Mehr
23.01.2025
 

A structural analysis of ordered Cs3Sb films grown on single crystal graphene and silicon carbide substrates
Mehr
12.12.2024
 

“Head-to-Toe” Lipid Properties Govern the Binding and Cargo Transfer of High-Density Lipoprotein
Mehr
13.11.2024
 

Our workshop "AtoB: Connecting novel microscopy methods to the science of the future" from 28 October to 1 November 2024 at the Lorentz Center@Oort...
Mehr
17.10.2024
 

The minimal membrane requirements for BAX-induced pore opening upon exposure to oxidative stress
Mehr
20.08.2024
 

A camera in Salzkammergut captures a photo with a 1000-year long exposure time!
Mehr