ONEM

Optical Near-field electron microscopy is a new idea for a microscope that uses the best of two worlds: Non-damaging probing with light, and high resolution using an electron-based read-out. The envisioned technique is damage-free, requires no labels, and allows for a resolution on the nanometer scale.

A detailed description of the proposal can be found here.

23.06.2025
 

We would like to congratulate ONEM team member Guido Stam, from Leiden University, on successfully defending his dissertation.
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01.04.2025
 

Pulsed laser deposition assisted epitaxial growth of cesium telluride photocathodes for high brightness electron sources
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23.01.2025
 

A structural analysis of ordered Cs3Sb films grown on single crystal graphene and silicon carbide substrates
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12.12.2024
 

“Head-to-Toe” Lipid Properties Govern the Binding and Cargo Transfer of High-Density Lipoprotein
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13.11.2024
 

Our workshop "AtoB: Connecting novel microscopy methods to the science of the future" from 28 October to 1 November 2024 at the Lorentz Center@Oort...
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17.10.2024
 

The minimal membrane requirements for BAX-induced pore opening upon exposure to oxidative stress
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