Optical Near-field Electron Microscopy

ONEM...

Optical Near-field electron microscopy is a new idea for a microscope that uses the best of two worlds: Non-damaging probing with light, and high resolution using an electron-based read-out. The envisioned technique is damage-free, requires no labels, and allows for a resolution on the nanometer scale.

A detailed description of the proposal can be found here.

10.03.2021
 

Optical Near-Field Electron Optics

Finally we can present more information on our project 'Optical Near-Field Electron Microscopy (ONEM), which aims at building a new microscope for the...

04.03.2021
 

Neues EU-Projekt 'ONEM' entwickelt ein einzigartiges hybrides Bildgebungsverfahren

Das Projekt ONEM wird eine neue nicht-invasive Mikroskopietechnik zur Abbildung dynamischer Prozesse an Grenzflächen entwickeln, die sogenannte...

08.02.2021
 

Kick-off of the 'Optical Near-field Electron Microscopy' project

In February, the official kick-off of our FET proactive project 'Optical Near-field Electron Microscopy (ONEM)' has taken place!