Optical Near-field Electron Microscopy


Optical Near-field electron microscopy is a new idea for a microscope that uses the best of two worlds: Non-damaging probing with light, and high resolution using an electron-based read-out. The envisioned technique is damage-free, requires no labels, and allows for a resolution on the nanometer scale.

A detailed description of the proposal can be found here.


Optical Near-Field Electron Optics

Finally we can present more information on our project 'Optical Near-Field Electron Microscopy (ONEM), which aims at building a new microscope for the...


Neues EU-Projekt 'ONEM' entwickelt ein einzigartiges hybrides Bildgebungsverfahren

Das Projekt ONEM wird eine neue nicht-invasive Mikroskopietechnik zur Abbildung dynamischer Prozesse an Grenzflächen entwickeln, die sogenannte...


Kick-off of the 'Optical Near-field Electron Microscopy' project

In February, the official kick-off of our FET proactive project 'Optical Near-field Electron Microscopy (ONEM)' has taken place!