ONEM

Optical Near-field electron microscopy is a new idea for a microscope that uses the best of two worlds: Non-damaging probing with light, and high resolution using an electron-based read-out. The envisioned technique is damage-free, requires no labels, and allows for a resolution on the nanometer scale.

A detailed description of the proposal can be found here.

27.06.2024
 

Unified Simulation Platform for Interference Microscopy
Mehr
13.06.2024
 

Growth of ultra-flat ultra-thin alkali antimonide photocathode films
Mehr
11.06.2024
 

Exhibition at the European Capitol of Culture 2024!
Mehr
11.06.2024
 

Our PhD student Hanieh Jafarian at MIT doing her secondment.

Mehr
24.05.2024
 

Quantum limits of position and polarizability estimation in the optical near field
Mehr
22.11.2023
 

The 7th ONEM Meeting took place on 18-19 September 2023 at the J. Heyrovský Institute of Physical Chemistry in Prague, Czechia.
Mehr